Welcome to Virtual-IPM’s documentation!¶
Contents:
- Introduction
- How to install the application
- How to use the application
- Examples
- Available computation models
- Parameter sweeps
- Command line utilities
- Use cases
- Beam profile deformation due to beam space charge
- Beam profile deformation due to guiding fields non-uniformities
- Correlations between electron and ion detection
- Gas-jet for IPM and BIF
- Multiple beams
- Simulation of meta-stable excited states and their influence on the measured beam profile (BIF)
- Studying trajectories of specific particles
- Electron background
- Electron wire scanner
- Secondary electrons
- Documentation for Developers
- Changelog
- Notes